Sensitive high-resolution ion microprobe - Wikipedia
网页The sensitive high-resolution ion microprobe (also sensitive high mass-resolution ion microprobe or SHRIMP) is a large-diameter, double-focusing secondary ion mass spectrometer (SIMS) sector instrument that was produced by Australian Scientific Instruments in Canberra, Australia and now has been taken over by …
Ion Microprobe - SpringerLink
网页2018年1月1日 · An ion microprobe (SIMS) uses high-energy ion beam to sputter surface materials of a solid sample. Because of this sampling method, the ion microprobe allows in situ elemental and isotopic analysis of a solid sample with μm-scale spatial resolution.
Ion Microprobe - an overview | ScienceDirect Topics
网页An Ion Microprobe is defined as an instrument that focuses an ion beam to micrometer dimensions for analyzing samples at trace levels. It consists of object slits, additional slit pairs, a lens system, and high-precision magnetic quadrupoles to produce beam spots of very small diameters.
Microprobe - Wikipedia
网页A microprobe is an instrument that applies a stable and well-focused beam of charged particles (electrons or ions) to a sample.
Sensitive High Resolution Ion Microprobe - Reverse Geometry
网页The SHRIMP-RG ion microprobe has been operational at Stanford University since 1998 and continues to provide high-resolution geochronologic and geochemical data to many researchers for a wide variety of investigations.
Introduction to SHRIMP-RG | Sensitive High Resolution Ion Microprobe ...
网页The SHRIMP-RG ion microprobe uses a focused beam of primary ions (typically O-, O 2-, or Cs +) to sputter secondary ions from the target material. The primary beam can be focused to a diameter of approximately 10 to 40 microns.
An evaluation of precision and accuracy of SIMS oxygen isotope …
网页2018年9月1日 · Since the 1980s, the SIMS (also called ion microprobe) technique have been increasingly adopted (Shimizu et al., 1978, Valley and Graham, 1991, Ireland, 1995, Valley et al., 1998, Tang et al., 2015, Kita et al., 2009, Ickert and Stern, 2013), and is powerful for in-situ oxygen isotope microanalysis.
Ion microprobe - SpringerLink
网页An ion microprobe is, therefore an analytical instrument based on the principles of secondary ion mass spectrometry (SIMS). Since the primary ion beam can be focused to a micron-scale spot, isotopic composition of elements and abundances of elements can be determined in situ with a micron-scale spatial resolution.
Ion microprobe analysis in geology | SpringerLink
网页The ion microprobe is a SIMS instrument with a focused primary ion beam, which permits in situ microanalysis of minerals in samples prepared as standard polished sections. Nearly all elements from H to U can be detected and many can be analysed quantitatively down to part-per-million levels, or below.
Ion microprobe analysisBasic principles, state-of-the-art …
网页An ion microprobe is an instrument that uses a finely focused primary ion beam to erode, or ‘sputter’ a solid sample and to collect secondary ions ejected during that process into a mass spectrometer generating a spatially resolved mass spectrum.