Abstract: A large number of ionograms recorded at Arecibo have been converted to electron density profiles. It is shown that the method of analysis can give very high accuracy for a single layer, but ...
The other is electron channeling contrast imaging (ECCI) in scanning electron microscope (SEM). In an SEM, near-surface defects can be identified because backscattered electron yield differs in defect ...
Surface visualization using backscatter scanning electron microscopy (BSEM) Three regions of interest (ROIs) were defined on each specimen along an imaginary line from top left to bottom right of the ...
Simple node module to download the ChromeDriver version for Electron. You can set the ELECTRON_MIRROR or NPM_CONFIG_ELECTRON_MIRROR environment variables to use a ...
This functionality, paired with contrast enhancement offered by backscattered electron imaging, supports quickly identifying fault regions, and a detailed examination of microstructural features.
Clone and run for a quick way to see Electron in action. This is a minimal Electron application based on the Quick Start Guide within the Electron documentation.